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MWPA-18C      Active probe 18C

MWPA-18C      Active probe 18C

Product Images Technical Specifications Associated Products

Technical Specifications

Active probe tip for characterization on internal nodes requiring a low input capacitance

  • The active arm has specific mounting to the micropositioner (specify when ordering)
  • A separate power supply provides power to the probes (up to 2 per power supply)
  • The replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
  • See the range of replaceable probes tips MWPA-R18C
  • Other models : 7, 7A, 12C, 19C, 28, 29, 34A, 35...

MOST POPULAR REFERENCES

  • MWPA-18C-250 : Shaft diamter 50µm, radius <3µm
  • MWPA-18C-420 : Shaft diamter 20µm, radius <1µm
  • MWPA-18C-450 : Shaft diamter 50µm, radius <3µm

Input Capacitance

0,02 pf

Leakage current

Few fA

Max Voltage

0 to +10 V

Signal attenuation

From 10:1 to 20:1

Rise/fall time

1.2 ns

Associated products

S1160-x - General purpose probe station
The S1160 will support a broad range of precision probing applications including IV, CV, dies, wafers... Modular, it can accept many options and accessories for multi-purpose (temperature, low current...) applications Accept basic microscope (bino / trino) or high power multi-objectives microscopeQuick platen lift allows replacing the wafer under test easilyHigh frequency RF version available WL1160 model...
CM210/310 - Submicronic checkmate probe station
The Checkmate serie represents the state of the art for probing stations, available for probing on individual die or on wafer up to 8" or 12". The probe stations allow high performance for pads probing or internal linesOn-site upgradability from one version to anotherA variety of options and accessories will fulfill all applications, including cold characterization @-65°C and femtoamp measurementTHE Tool for design validation, failure analysis, small production testing(manual loading of the wafer or die) ...
CM210/310 - Submicronic checkmate probe station
The Checkmate serie represents the state of the art for probing stations, available for probing on individual die or on wafer up to 8" or 12". The probe stations allow high performance for pads probing or internal linesOn-site upgradability from one version to anotherA variety of options and accessories will fulfill all applications, including cold characterization @-65°C and femtoamp measurementTHE Tool for design validation, failure analysis, small production testing(manual loading of the wafer or die) ...
For technical and commercial information, quote, ordering or request of visit by our representative. +33 (0)476 561 617

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Grenoble / France

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TVA FR 48 381 001 171