Manual Probe Station

Search results for "Manual Probe Station"

71 products found

CM170High stability manual probe station

From two model combination, the CM170 probe stations allows stability and accuraccy for moderate price.

- Large platen for frequency extender head use
- Multiple applications (optical, probecards, HF...)

MOST POPULAR REFERENCES

CM170 : DC to 100 MHz measurements
WL170 : DC to 110 GHz measurements
WL170-THz : mmW up to 1.1 THz (special raised chuck)

UH114Manual wafer / frame film mounter

The UH114 are manual wafer film (wafer mounter) mounting systems up to 12".
For dicing/sawing applications, uniform lamination of an adhesive plastic film is essential. Our machines feature a set of easily adjustable spring loaded rollers as well as film tension bars along the X and Y axes to ensure bubble-free lamination of the film onto the wafer and frame. Additionally, these models feature a shrink film cutting system with adjustable cutting pressure to accommodate different tape base materials and thicknesses.

Roller pressure is adjusted to meet different process requirements and to accommodate different wafer thicknesses. This moves manually along the substrate once the film is stuck. A digital temperature controller ensures consistent temperatures on the chuck for repeatable mounting.

Adjustable alignment brackets and suction cups fit almost all types of film frames including plastic ones. The chuck height is also adjustable relative to the frame height for different wafer thicknesses.

Technical specificities:

- Available in 6", 8" or 12" version
- Adapter to make 6" on 8" machine or 8" on 12" machine possible
- Protective film winder roller assembly for use with film with support layer
- Easily adjustable spring roller assembly
- Uniform film tension
- Uniform adhesion allows for bubble-free lamination
- Circular cutter (wheel type) to cut the film on the film frame
- Adjustable cutting pressure for different films (thickness/hardness)
- Temperature-controlled digital screen
- Chuck height adjustable from top of unit
- Works with film without support or with support (optional)
- Fits wrapped protective film/layer externally or internally.
- Adjustable alignment pins and suction cups
- Accepts all types of film (specify type and size)
- End cutter for film separation
- Anti static electricity system

MW-Pack4PP-M4 point probe manual measurement package medium resistivity range

Manual sheet resistivity measurement systems for laboratories, for research and small productions. The stand includes several features enabling it to measure resistivity and surface resistance using 4 precise points. It is possible to characterize materials manufactured by semiconductor doping, metal or glass deposition, rubber materials, etc.

A manual lever makes it possible to make a movement in Z of contact and non-contact with a repeatability of the order of a micron. In addition, an adjustment wheel located on the top of the device makes it possible to fine-tune the movement in Z with precision.
The sample to be tested is mounted on a mobile support which allows it to be easily placed under the measuring head between each measurement point.
In addition, the equipment has several chuck sizes ranging from 4" to 12".

Applications:

- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCO
- Oxide deposit
-Sensors, MEMS
- Conductive polymer
- Batteries
- Electrodes
- Photovoltaic
- Ceramic & Glass
- Optoelectronic component
- Nanomaterials

Specifications:

• I/V measurement, sheet resistance, resistivity or thickness
• Cartography
• A micro-switch ensures the injection of current from the moment all the tips are in contact.
• The measurement is performed by an external Keithley 2450 device.
• Software for data processing
• Creation of an I/V curve
• Bipolar measurement
• Data export in Txt, Excel, CSV format...

The measurement system uses software for measurement and display of results that allows data export for later data processing. It is possible to map the sample according to the resistivities or thicknesses measured.
The user entered the size and shape of the sample, the exclusion edge and the number of points to be tested. A graphic image of the target measurement points is displayed. At the end of the test of all the points, we find the average of the measured values, the standard deviation as well as the maximum and minimum measurement.

HMS3000Manual Hall Effect measurement system

Discover our HMS3000 manual Hall effect system, designed for studying and characterizing the electrical properties of semiconductor materials and thin films. This educational and experimental equipment allows for the precise analysis of charge carrier mobility, carrier concentration, and resistivity of samples.

By measuring the voltages generated by Lorentz forces via its permanent magnet module, the system provides a concrete understanding of electronic transport phenomena and the effects of material doping. Compatible with the Van der Pauw method, it enables reliable measurements on various geometries and thin films.

Robust and easy to use, this manual Hall effect system is ideal for higher education laboratories, research centers, and characterization applications in semiconductor physics and materials science.

It is thus possible to calculate:

• Charge carrier mobility
• Majority carrier density (dopants)
• Doping type (P/N ratio)
• Hall voltage / Hall coefficient
• Surface resistances, resistivity, conductivity

Features:

• Sample size: 5x5 mm to 20x20 mm
• Measurement at two temperatures: ambient and 77 K
• Single or double magnet
• LN2 chamber
• ITO reference sample
• Different SPCB sample holders depending on the application

Applications:

- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCOs
- Optoelectronic component
- Nanomaterials - Sensors, MEMS
- Conductive polymer
- Oxide deposit
- Ceramic & Glass
- Batteries
- Electrodes
- Photovoltaic

H1504" manual probe station

Easy use probe station for wafers up to 100 mm.

- XY chuck movement
- Quick platen lift
- Up to 6 micropositioners or a probecard
- Fixed microscope holder

S1160B-8N8" manual analytical probe station

Probe station under tips for precision analyses, such as IV, CV, on chips alone, on wafers, on components, etc. Modular, the S1160 can accommodate several options and accessories for a multitude of applications (temperature, low current measurements, etc.).

- Rapid elevation of the plate by manual arm (contact / non-contact)
- Accepts binocular and trinocular microscopes
- Wafers up to 8'' (200mm wafers)
- Angular adjustment of the Wafer
- Accommodates up to 8 DC micropositioners or a pin board
- Massive chassis for better stability

COMMON REFERENCES:

S1160A-8N: Optical bridge movement for turret microscope
S1160B-8N: Movement of the optical bridge for trinocular stereozoom microscope
S1160C-8N: Fixed optical bridge for trinocular stereozoom microscope

QUADPRO2MManual 4 point probe measurement system

4-point manual in-line temperature measurement system on samples ranging from 10mm to 300mm in diameter.. Capable of measuring surface resistance ranges from 10μΩ/sq to 10GΩ/sq. Several versions possibles to optimize measurement accuracy according to the ranges measured.

Equipment feature:

• V/I measurement, sheet resistance, resistivity or thickness
• Mean, Standard Deviation, Minimum, Maximum and 3Sigma reports for the dataset
• Temperature Coefficient of Resistance (TCR) measurements
• Automated 2D mapping, 3D mapping and cross-section
• Ultra high precision and repeatability
• Comparative mapping

The TCR option

The Resistance Temperature Coefficient option integrates sample temperature control as well as automated injected current control and resistance calculations. Integrated with a thermal chuck system, the test automatically sweeps temperatures over a wide range without moving the test tips.
Measurements are taken at each target temperature and the results are plotted on a graph. The TCR is expressed in parts per million (PPM). Users define the temperature range, steps, and delay for each test point before taking a measurement. A variety of thermal chucks are available to set the range and resolution from room temperature to 300°C, with 1° resolution.
Data can be printed or exported to a spreadsheet for further analysis.

TF labManual Eddy Current tester

The EddyCus® lab 2020 SR Series is a compact, benchtop system designed for non-contact, single-point measurements of conductive thin films, metal layer thicknesses, and sheet resistance using eddy current technology. It enables fast, accurate measurements of samples up to 200 x 200 mm² (8 x 8 inches) and supports a broad range of materials, including thin metal layers, doped wafers, and conductive polymers.

The EddyCus® lab 2020 offers a modern, contact-free alternative to traditional 4-point probe (4PP) and other contact-based measurement methods. Unlike 4PP systems, it requires no physical contact, no surface preparation, and is unaffected by encapsulations or surface roughness. You can learn more about the comparison between eddy current and 4PP methods.

These advantages make the EddyCus® lab 2020 an excellent choice for R&D laboratories, quality control, and process monitoring, where speed, repeatability, and non-destructive testing are essential.

The EddyCus® lab 2020, which exists in several versions, allows measurements of:
- Surface resistance
- Resistivity
- Metal layer thickness
- Conductivity
- Anisotropy
- Emissivity

Advantage:
- Non destructive measurement
- Ultra-fast non-contact real-time measurement
- Accurate measurement of conductive thin layers at different penetration depths
- Characterization of hidden and encapsulated conductive layers
- Easy to use software & display of results in real time

Applications:
- Display, touch screen and flat screen
- OLED and LED applications
- Graphene layers
- Wafer and photovoltaic cells
- Semiconductor wafer
- Metallization layer and wafer metallization
- Battery electrodes
- Paper and textile conductors
- Organic conductor
- Polymer
- Coated architectural glass
- Smart electrochromic glass, Smart Glass

MW-Pack4PP-H4 point probe manual measurement package high resisitivy range

Manual sheet resistivity measurement systems for laboratories, for research and small productions. The stand includes several features enabling it to measure resistivity and surface resistance using 4 precise points. It is possible to characterize materials manufactured by semiconductor doping, metal or glass deposition, rubber materials, etc.

A manual lever makes it possible to make a movement in Z of contact and non-contact with a repeatability of the order of a micron. In addition, an adjustment wheel located on the top of the device makes it possible to fine-tune the movement in Z with precision.
The sample to be tested is mounted on a mobile support which allows it to be easily placed under the measuring head between each measurement point.
In addition, the equipment has several chuck sizes ranging from 4" to 12".

Applications:

- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCO
- Oxide deposit
-Sensors, MEMS
- Conductive polymer
- Batteries
- Electrodes
- Photovoltaic
- Ceramic & Glass
- Optoelectronic component
- Nanomaterials

Specifications:

• I/V measurement, sheet resistance, resistivity or thickness
• Software for data processing
• Creation of an I/V curve
• Bipolar measurement
• Data export in Txt, Excel, CSV format...
• A micro-switch ensures the injection of current from the moment all the tips are in contact.
• The measurement is performed by an external Keithley 2635B device.

The measurement system uses software for measurement and display of results that allows data export for later data processing. It is possible to map the sample according to the resistivities or thicknesses measured.
The user entered the size and shape of the sample, the exclusion edge and the number of points to be tested. A graphic image of the target measurement points is displayed. At the end of the test of all the points, we find the average of the measured values, the standard deviation as well as the maximum and minimum measurement.

UH104Manual UV curing system

Benchtop low-profile system, the UH104 offers an exceptional flexibility and repeatability in the curing of UV films for dicing or backgrinding.UV insolators are illumination systems allowing the rapid curing of all types of photo-sensitive materials. Mainly used in the semiconductor world, they solidify the glue present on the adhesive films used during the cutting process. Safe for the environment, this UV curing process takes place at room temperature and at a wavelength of 365nm.

Technical specifications:

• Compact 8" or 12" system
• Manual loading, automatic process
•Rectangular substrates up to 12"
• Environmentally friendly, ozone-free UV lamp
• Fast curing time
• Easily programmable microprocessor based controller
• Repeatable manual operation
• Exceptional cost/performance ratio
• Low temperature 365nm UVA curing process
• Very energy efficient
• Quartz glass window
• Lamp intensity measurement port

Options:

- Motorized and rotating work platform
- 6" or 8" film frame adapter
- UV Lamp Intensity Radiometer (requires sensor/attenuator assembly, below)
- Sensor/attenuator assembly (requires radiometer above)

WL210LE8" high accuracy RF manual probe station with local enclosure

This probe station is derivated of the Checkmate series. It includes an additional local chamber that allow temperature measurement (hot/cold) or very low current application

- fA measurements (low leakage)
- Light-tight environnement
- Electrical shielding
- Configuration : 4 HF port or 8 DC/Kelvin port or HF/DC combination
- 300mm version available
- Compatible with high performances ERS chuck (patented air cooling system, temperature from -60°C to 300°C)

WL170-THzHigh stability Millimetric manual probe station

Station specially designed for ultra high frequency applications, with the use of millimetric heads (extenders).
This system allows you to mount a micropositioner with a large plate that can support extenders from the main manufacturers (R&S, VDI, etc.).

- Up to 1.1 THz
- Raised chuck
- Rotation lock
- Long working distance microscope

WL2108" high accuracy RF manual probe station

The WaveLink series represents the most accomplished HF probing stations, available for wafer up to 12".

- No resonnance up to 500 Ghz
- Upgradability from one version to another
- Manual or Semi-automatic version
- Optional thermal charactherization (-60°C to 300°C)
- Allows up to 4 RF micropositioners and 4 DC micropositioners simultaneously

MOST POPULAR REFERENCES

WL210 : Version 200 mm
WL310 : Version 300 mm

CM2108" high accuracy manual probe station

The Checkmate series represents the most accomplished probing stations, available for wafer up to 12".

- Upgradability from one version to another
- Manual or Semi-automatic version
- Test on Probecards available
- Optional thermal charactherization (-60°C to 300°C)
- High voltage (HV) and low current (fA) measurements possible
- Allows up to 8 DC micropositioners or probe card

MOST POPULAR REFERENCES

CM210 : Version 200 mm
CM310 : Version 300 mm

WL1160B-8N8" RF manual analytical probe station

Economical while professional prober for RF and Microwave probing applications, available for single die, partial or full wafer up to 8".

- DC to 110 GHz measurement
- Stable platen and specific anti-resonant chuck construction
- Individual chuck for RF probes with independant rotation
- Quick lift platen and fine Z adjustment
- Allows binocular or trinocular microscope (Tilt-back clearing option)
- Accept up to 4 RF micropositioners and 4 DC micropositioners simultaneously

MOST POPULAR REFERENCES

WL1160A : Moving of optical bridge for turret microscope
WL1160B : Moving of optical bridge for trinocular stereozoom microscope
WL1160C : Fixed optical bridge for trinocular stereozoom microscope

PP-ONEManual Placer

Multipurpose plateform for pick and place.
Small production ( < 500 000 pieces/year).

The Manual Sorter PP-One model is designed for accurate Picking and Placement of delicate devices as Laser Diodes and Laser Bars.
The machine will pick the components from wafer hoops to place them into GelPack or Waffle Packs.

UH130Semi-automatic die matrix expander

The UH130 automatically expands the adhesive tape so as to present the dies in an evenly spaced parallel matrix to facilitate pick-and-place or die bonding operations, adapt to all wafer/film frame up to 300 mm.Thanks to ultra-precise control of the separation process, it allows a higher throughput and increased efficiency in the treatment of micro-components.
UH130 equipment facilitates this by maintaining the orientation of the dies and a constant spacing thereof. It is compatible with a wide range of frames (and therefore wafer sizes) as well as all types of adhesive films (standard, UV, extra-adhesive, etc.)

Technical specifications:

• 8" and 12" compatible
• Pneumatic cylinder with speed control and 2.3" adjustable stroke (cylinder height)
• Motorized circular cutting assembly
• Emergency stop with manual clamp
• Chuck heated and temperature controlled digitally with thermistor
• Adjustable stroke stop, allowing constant repeatability of expansion
• Plexiglas protective cover, antistatic
• Precisely controlled die separation distance for consistent repeatability
• Alignment markers allow easy and precise placement of the film frame
• Reduced alignment times and increased throughput of automated processes
• Convenient: tabletop system, easy to use
• Operator variables virtually eliminated

Options:

- Motorized circular cutting set
- Possible ring/ring version

S3024 point probe stand

The configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 4" or 6", the sample positioning is manual as well as the contact of the tips by a rotating lever.

Applications:

- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCO
- Oxide deposit
-Sensors, MEMS
- Conductive polymer
- Batteries
- Electrodes
- Photovoltaic
- Ceramic & Glass
- Optoelectronic component
- Nanomaterials

Specifications:

• A micro-switch insures that the current will be injected only after contact of the 4-point probe head
• The measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family, which can be supplied if requested
• The system can be upgraded to include the measurement and display onto a PC
• Perfect tool for for laboratories, universities, research centers... in the material characterization.

CM4656" semi-automatic probe station

Semi-automatic probing stations for full wafer electrical characterization.

- Software : mapping, auto-alignment, pattern recognition, autofocus...
- X-Y stage drives by induction motor for high speed and accuracy
- Probecard application available
- High voltage (HV -10kV) and low leakage (fA) measurements
- Tool developed for design validation (R&D) and yield monitoring (production)

HCP621G-MPGastight mini probe station

Mini test station for temperature and controlled atmosphere measurements.
This completely hermetic ultra-compact station offers you a wide range of possibilities. Rhenium tungsten tips manually manipulated and can be placed on studs >= 100µm.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip

Specifications:

• Measurements on unit samples
• Manual positioning 4 mobile spring-mounted prongs.
• Temperature range: -190°C to 600°C
• Injection of neutral gas (Argon, Nitrogen)

Comparison with -PM version:

For more sensitive application, the -MP has sliding probes which do not move during thermal expansion of the sample and thus do not scratch the sample electrodes whereas the -PM can scratch the pads. The -MP can also be upgraded to an -MPS later.

HCP-600-G-PMGastight mini probe station

S3034 point probe stand large area

The configuration is composed of a stand holding the probe head with a quick Z lever and a chuck for wafer of 8" or 12", the sample positioning is manual as well as the contact of the tips by a rotating lever.

Applications:

- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCO
- Oxide deposit
-Sensors, MEMS
- Conductive polymer
- Batteries
- Electrodes
- Photovoltaic
- Ceramic & Glass
- Optoelectronic component
- Nanomaterials

Specifications:

• A micro-switch insures that the current will be injected only after contact of the 4-point probe head
• The measurement itself is provided from an external sourcemeter and voltmeter typically Keithley family, which can be supplied if requested
• The system can be upgraded to include the measurement and display onto a PC
• Perfect tool for for laboratories, universities, research centers... in the material characterization.

HCP421V-PMHNo-magnetic vacuum mini probe station

Mini test station for temperature measurements, under vacuum and non-magnetic.
This completely hermetic ultra-compact station offers you a wide range of possibilities. Rhenium tungsten tips manually manipulated and can be placed on studs >= 100µm. This non-magnetic station will allow you to perform measurements with Helmholtz coils.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip
-Test under magnetic fields

Specifications:

• Station for performing vacuum measurements inside a Helmholtz coil system
• Dimensions of the station 180 mm x 130 mm x 26.5 mm
• Measurements on unit samples, size 38x42 mm
• Manual positioning 4 mobile spring-mounted prongs
• Temperature range: -190°C to 400°C
• Vacuum-tight chamber

MW-PS50Compact optical profilometer

Designed with Chromatic Light technology, which measures wavelengths, PS50 offers the highest precision on all roughnesses, all shapes and all materials. Transparent or opaque.

Thanks to a displacement of 50 x 50 mm on the X-Y axes, this portable optical profilometer allows high-speed measurements and does not require gluing of images.

A compact unit with high speed sensor is truly a gateway to the frontier of profilometry.

Benefits:

- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers

MW-Jr100High speed optical profilometer

Designed with Chromatic Light technology, which measures physical wavelength, Jr100 Profiler delivers the highest accuracy on all roughnesses, shapes and materials. Transparent or opaque.

Thanks to a travel of 100 x 100 mm on the X-Y axes, this portable optical profilometer allows high-speed measurements and does not require image sticking. With its small footprint and weight of only 17 kg, the JR100 can be transported easily to any location.

A portable unit with a high-speed sensor is truly a gateway to the frontier of profilometry.

Benefits:

- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers

MW-Jr25Portable optical profilometer

Designed with Chromatic Light technology, which measures physical wavelengths, Jr25 Profiler offers the highest precision on all roughnesses, all shapes and all materials. Transparent or opaque.

With a fully rotating drive head, compact design and complete portability, no surface is out of reach. This portable profilometer opens the door to research and quality control testing in complex environments that were beyond the reach of previous generations of instruments.

Lab instrument performance now available as a carry-on.

Benefits:

- Best on wide angle surfaces
- Fast for large surfaces
- Very easy to use
- No image stitching
- No sample preparation
- No vertical recentering

Applications:

- Organic surface topography
- Fossil microstructure
- Fractography of machined parts
- Lens surface analysis
- Roughness of polymers

HCP-400-V-PMVacuum mini probe station

Mini test station for temperature and vacuum measurements.
This completely hermetic ultra-compact station offers you a wide range of possibilities. Rhenium tungsten tips manually manipulated and can be placed on studs >= 100µm.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip

Specifications:

• Measurements on unit samples, size 28x30 mm
• Manual positioning 4 mobile spring-mounted prongs.
• Temperature range: -190°C to 400°C
• Vacuum capability up to 1 mTorr

QUADPRO2ASemi-automatic 4 point probe measurement under temperature

Semi-automatic 4-point in-line temperature measurement system on samples ranging from 10mm to 300mm in diameter.. Capable of measuring surface resistance ranges from 10μΩ/sq to 10GΩ/sq. Several versions possibles to optimize measurement accuracy according to the ranges measured.

Equipment feature:

• V/I measurement, sheet resistance, resistivity or thickness
• Mean, Standard Deviation, Minimum, Maximum and 3Sigma reports for the dataset
• Temperature Coefficient of Resistance (TCR) measurements
• Automated 2D mapping, 3D mapping and cross-section
• Ultra high precision and repeatability
• Comparative mapping

The TCR option

The Resistance Temperature Coefficient option integrates sample temperature control as well as automated injected current control and resistance calculations. Integrated with a thermal chuck system, the test automatically sweeps temperatures over a wide range without moving the test tips.
Measurements are taken at each target temperature and the results are plotted on a graph. The TCR is expressed in parts per million (PPM). Users define the temperature range, steps, and delay for each test point before taking a measurement. A variety of thermal chucks are available to set the range and resolution from room temperature to 300°C, with 1° resolution.
Data can be printed or exported to a spreadsheet for further analysis.

CM2508" semi-automatic probe station

Semi-automatic probe stations for full wafer electrical characterization up to 8" (200 mm).

- Software : mapping, auto-alignment, pattern recognition, autofocus...
- Probecard application available
- Temperature characterization up to 600°C
- High voltage (HV - 10kV) and low leakage (fA) measurements
- Tool developed for design validation (R&D) and yield monitoring (production)
- Configuration : up 10 ports DC/Kelvin
- Compatible with high performances ERS chuck (patented air cooling system, temperature from -60°C to 300°C)

MOST POPULAR REFERENCES

CM250 : Version 200 mm
CM350 : Version 300 mm

WL250-LE8" HF semi-automatic probe station with local enclosure

Semi-automatic probing stations for full wafer HF electrical characterization.

- Software : mapping, auto-alignment, pattern recognition, autofocus...
- Probecard application available
- Thermal characterization from -60°C to 300°C
- HF measurements up to 110 GHz
- Tool developed for design validation (R&D) and yield monitoring (production)
- Configuration : up 4 ports HF (N, S, E, W) and 4 DC
- Optional local enclosure for EMI shielding and light-tight

MOST POPULAR REFERENCES

WL250 : 200 mm version
WL350 : 300 mm version
WL250-LE : 200 mm with local enclosure
WL350-LE : 300 mm with local enclosure

PTSE-OOsmium probe tip

Osmium straight probe tip, the rigid body can be bent and/or cut to clear space above for very short working distance objectives.

- The standard application is probing on pads and/or internal lines
- The Osmium material is particularly suited for soft surface needing a good contact

PTSE-TGGold plated tungsten probe tip

Gold plated tungsten straight probe tip, the rigid body can be bent and/or cut to clear space above for very short working distance objectives.

- The standard application is probing on pads and/or internal lines
- Tip material provide a good answer to probing on soft surface

PTSE-PPalladium probe tip

Palladium straight probe tip, the rigid body can be bent and/or cut to clear space above for very short working distance objectives.

- The standard application is probing on pads and/or internal lines
- The palladium material is particularly suitable for surfaces that are difficult to contact or for low current measurements

PTSE-TCTungsten carbide probe tip

Tungsten carbide straight probe tip, the rigid body can be bent and/or cut to clear space above for very short working distance objectives.

- The standard application is probing on pads and/or internal lines
- Tip material provides a good answer to probing on hard surface and for continuous probing

WL350-LE12" HF semi-automatic probe station with local enclosure

PTSE-20BCBeryllium copper probe tip

beryllium copper straight probe tip, the rigid body can be bent and/or cut to clear space above for very short working distance objectives.

- The standard application is probing on pads and/or internal lines
- Tip material provides a good answer to probing at high current or on soft surface

CM35012" semi-automatic probe station

Semi-automatic probe stations for full wafer electrical characterization up to 12" (300 mm).

- Software : mapping, auto-alignment, pattern recognition, autofocus...
- Probecard application available
- Temperature characterization up to 600°C
- High voltage (HV - 10kV) and low leakage (fA) measurements
- Tool developed for design validation (R&D) and yield monitoring (production)
- Configuration : up 10 ports DC/Kelvin
- Compatible with high performances ERS chuck (patented air cooling system, temperature from -60°C to 300°C)

MOST POPULAR REFERENCES

CM250 : Version 200 mm
CM350 : Version 300 mm

S47Probe card adapter

Mechanical fixture for mounting a probecard of 4.5" width (114 mm) on a probe station.

- Provide signals to the DUT while making analysis with a lot of separate needles.
- 2 models are available, one with no adjustment, another with theta adjustment.

TRXTriax probe holder

Very low-noise probe holder (± 2 fA when used with a triaxial chuck and in an electrically shielded environment).

Can be mount onto S725P, S926P, SP100P, SP150P micropositioners.

MW-SCA50Coaxial HF-Low-current probe

The coaxial Probe is designed for low-level signal probing (lower than 10fA@150°C)

- The probe's single unit design is especially desirable for the best possible electrical characteristics
- The Coaxial Probe is also offered with optional Ground Plane, Kelvin and resistor series /parallel configurations
- The Probes are constructed of microwave-quality components with a 50 Ohm semi-rigid cable shield being achieved through the utilisation a Teflon dielectric
- The probe contact protrudes from the shielding by .150" (3 mm) to maintain low-level signal noise to the probe
- Tips available (replaceable) from 0.5 µm to 20 µm
- The connector is a standard SSMC

SP44 point probe head

4-point head for ambient temperature, usable on equipment of the Pack4PP, Quadpro series and or for separate use. The standard head is designed in delrin with 4 independent tips in tungsten or osmium. A bayonet and two screws make it easy to attach the tip to our 4-prong stand for precise and repeatable measurements.

Specifications:

• Material of the tips defined according to application & type of layer
• Choice of parameters: Tip spacing (pitch), tip fineness, tip pressure
• Terminations: Flying leads, banana plugs, BNC, triaxial cables, 9-pin connector...

MWPHCHigh Current Probe

The Kelvin-capable HCP high current probe is the only probe design on this type in the industry today. The multi-probe design distributes current among the contact points and heat sink remove heat from probe-pad interface to prevent overheating. The unique design gives the user the ability to have Kelvin access to device at the pad level.

- Specs PowerPro 3kV triax / 10kV coax, 450A pulsed / 10A DC
- Tungsten probes, ceramic body for high temperature use
- Mounting on RF positioner
- Complementary to our PowerPro probe systems

ProbecardProbe card

The probecards fullfill all production probing applications and particularly the highly demanding nowadays circuits : high pincount, ultra-fine pitch, multi-DUT testing, specific constraint (low-k, probe over active area....).

- Pcb design available for custom boards (all commercial testers)
- All services of specific design, manufacture, diagnostic and repair, alignment...
- Available for pads test or bumps tests

MWPA-10High-Speed passive multipurpose probe

Multipurpose passive high-speed probe, used for driving and receiving signals, frequency response from DC to 11 GHz (500 ohm input impedance mode).

- Adaptable on any micropositioner, specify type
- Coaxial 50 ohm cable included (1 m long), terminated by SMA and miniature connector to the coaxial probes
- Easily replaceable coaxial probe tips of 1.5 inch long, 1 or 2 probe points
- Tailored to different input impedance, 50, 250, 500 or 5k ohm by input resistance added

SRM232Hand-held 4 point probe system

The portable resistivity system is a device that offers the possibility of measuring resistivity, resistance, surface resistance or thickness on a wide variety of materials of varying sizes. Thanks to its battery operation, this system has versatile applications that can be used in various fields.

Applications:

- Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCO
- Oxide deposit
- Photovoltaic
- Ceramic & Glass
- Optoelectronic component
- Nanomaterials
-Sensors, MEMS
- Conductive polymer
- Batteries
- Electrodes

Specifications:

• 4 models/measurement ranges available with suitable calibrator
• Interchangeable 4-point head
• Applications: Conductivity/resistivity of layers on large panels, fuselages, bodywork... or in totally mobile measurement on an external site.

PTG4Copper probe tip with tungsten wire

The wire-tip combines a rigid body with a thin tungsten wire of various diameters, the probe tip is then soft enough to avoid damaging the probing pad materials.

- Length of body 51 mm, tungsten wire 3 to 5 mm
- Body diameter 0.51 mm, wire 5 to 125 microns
- Tip radius 0.1 to 5 microns
- Most popular references : PTG410, PTG422, PTG435, PTG4135
- Download the full list below for more information

MW-SCA250Coaxial Kelvin probe

The Kelvin Coaxial Probes are designed for low-level signal probing. The single unit design is especially desirable for the best possible electrical characteristics and improbes tip control over conventional dual tips design

- The Probes are constructed of microwave-quality components
- The 50 ohm semi-rigid cable consists of 8 mil tungsten wire forming the inner conductor and probe point, with isolation from the gold plated copper shield being achieved through the utilisation a Teflon dielectric
- The probe contact protrudes from the shielding by .150" (3 mm) to maintain low-level signal noise to the probe tips available from 0.5 µm to 12.5 µm
- Standard SSMC connector, series / parallel resistor configurations available in option

MWRF-50ARF probe 50 GHz

Serie of probes for RF Microwave applications up to 50GHz, GSG, GS, SG or "dual" configurations (dual = 2 probes on 1 micropositioner)

- These probes are available in different pitches from 25µm to 1250µm
- Various mounting styles for micropositioners
- Female connector 2.4mm
- Available in BeCu, Tungsten or Nickel
- Non Magnetic option
- High temperature and High Power options, please ask us

UxTBCoaxial Probe holder with teflon isolation

This probe holder allows to mount a probe tip with an angle of 45°.

It is useful for low noise IV measurements with it teflon insulation.

UxGBCoaxial Probe holder with ceramic isolation

This probe holder allows to mount a probe tip with an angle of 45°.

It is useful for low noise IV measurements with it insulation and for high temperature, up to 600°C.

MWPA-7Active probe model 7

The model 7 is designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes.

- A flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms avoids undesirable reflections
- A special miniature connector receives replacement coaxial probe tips providing a shielded environment to within 3 mm of the fine tungsten probe point
- Other models : 7, 7A. For every micropositioner (please specify the model)
- For temperature applications up to 200°C, the models MWPA-7-HT and MWPA7A-HT are available

USStandard Probe holder with screw lock

This probe holder allows to mount a probe tip with an angle of 45°.

It is useful for standard IV measurements.
The tip holding is done by screw for very small footprint.

MWPA-35Active probe 35

Active probe tip for characterization on internal nodes requiring a low input capacitance

- The active arm has specific mounting to the micropositioner (specify when ordering)
- A separate power supply provides power to the probes (up to 2 per power supply), ref. MW-PS3
- Frequency range DC to 26 GHz
- The replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
- See the range of replaceable probes tips MWPA-R12C
- Other models : 7, 7A, 12C, 18C, 19C, 28, 29, 34A

PTG20Tungsten probe tip

General purpose probe tip sharpened at one extremity, the body material (tungsten) is strong enough to be bent into a variety of shapes.

- The standard application is probing on pads and/or internal lines
- Material tungsten, length 38 mm, tip radius from 0.5µm to 100µm
- Nickel-plated option is available for body only (easy soldering), please add the suffix ''N'' to the P/N

PT110110 GHz flexible cable for RF probe

UTiFLEX® microwave cable assemblies are constructed using a low or ultra-low-density PTFE dielectric coupled with fully shielded outer conductors and a unique connector attachment that withstands mechanical and thermal stresses far better than standard connectors.
The result: Excellent loss characteristics, outstanding phase stability, and superb flexibility compared to standard flexible cables — all without sacrificing mechanical integrity.

Manufactured in Pottstown, PA, location, under the expert guidance of our professional engineering team, every UTiFLEX cable assembly is tested for insertion loss and SWR, and shipped with an individual test certificate.

UFP088D67 GHz flexible cable for RF probe

MWPA-34AActive probe 34A

Active probe tip for characterization on internal nodes requiring a low input capacitance

- The active arm has specific mounting to the micropositioner (specify when ordering)
- A separate power supply provides power to the probes (up to 2 per power supply), ref. MW-PS2
- Frequency range DC to 3 GHz
- The supplied replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
- See the range of replaceable probes tips MWPA-R12C
- Other models : 7, 7A, 12C, 18C, 19C, 28, 29, 35...

MWPA-28Active probe 28

Active probe tip for characterization on internal nodes requiring a low input capacitance

- The active arm has specific mounting to the micropositionner (specify when ordering)
- A separate power supply provides power to the probes (up to 2 per power supply), ref. MW-PS2
- Frequency range DC to 1 GHz
- The supplied replaceable probe tip includes a MOS at the input and mounts onto the active ar, several tip shank diameters and radius are available
- See the range of replaceable probe tips MWPA-R28
- Other models : 7, 7A, 12C, 18C, 19C, 29, 34A, 35

MWPA-12CActive probe 12C

Active probe tip for characterization on internal nodes requiring a low input capacitance

- The active arm has specific mounting to the micropositioner (specify when ordering)
- A separate power supply provides power to the probes (up to 2 per power supply), ref. MW-PS2
- Frequency range DC to 500 MHz
- The replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
- See the range of replaceable probes tips MWPA-R12C
- Other models : 7, 7A, 18C, 19C, 28, 29, 34A, 35...

MWPA-18CActive probe 18C

Active probe tip for characterization on internal nodes requiring a low input capacitance

- The active arm has specific mounting to the micropositioner (specify when ordering)
- A separate power supply provides power to the probes (up to 2 per power supply)
- The supplied replaceable probe tip includes a MOS at the input and mounts onto the active arm, several tip shank diameters and radius are available
- See the range of replaceable probes tips MWPA-R18C
- Other models : 7, 7A, 12C, 19C, 28, 29, 34A, 35...

MW-CSCalibration substrate for RF probe

Calibration substrate series for RF probes, that allow high accuracy measurements.

- GSG, GS, SG or dual (GSSG, GSGSG...) configurations
- Through, short, load (50ohms)...
- Gold plated pads
- Calibration kit for analyzer (R&S, HP...)

MWRF-325B(BT)High performance RF probe from 220 to 325GHz

Serie sof high performance probes for Microwave application from 220 to 325GHz, GSG, GS or SG configuration.

- These probes are available in different pitch from 25µm to 90µm
- We recommend a GSG footprint for best performance
- Low loss and low dispersion characteristics, reliable low resistance contact
- WR-3 waveguide, Bias T option available
- Available in BeCu

MWRF-ECP18RF probe 18 GHz

Series of probes for RF Microwave application up to 18GHz, GSG, GS, SG and Dual.

- These probes are available in different pitch from 100µm to 2500µm, per 25µm step
- Various mounting styles for positionners
- Non Magnetic option, please ask us

UPStandard Probe holder with spring lock

This probe holder allows to mount a probe tip with an angle of 45°.

It is useful for standard IV measurements.
The tip holding is done by spring for a quick and safe assembly.

MWRF-67ARF probe 67 GHz

Serie of probes for RF Microwave applications up to 67GHz, GSG, GS, SG or "dual" configurations (dual = 2 probes on 1 micropositionner)

- These probes are available in different pitches from 25µm to 1250µm
- Various mounting styles for micropositionners
- Female V connector 1.85mm
- Available in BeCu or Tungsten
- Non Magnetic option
- High temperature and High Power options, please ask us

HCP421V-MPSVacuum mini probe station

Mini test station designed specifically to perform temperature and vacuum measurements.
This station is fully sealed, allowing it to provide a controlled and stable measurement environment. Thanks to this station, you benefit from a wide range of possibilities for your experiments.
The tips used in this station are made of tungsten rhenium, which makes them very resistant and reliable. These tips can be manipulated using micropositioners, which facilitates their precise placement on pads whose size is greater than or equal to 10 µm.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip

Specifications:

• Measurements on unit samples, size 28x30 mm
• Manual positioning with 4 micropositioners (Up to 7 micropositioners)
• Temperature range: -190°C to 400°C
• Vacuum capability up to 1 mTorr

HT4High temperature 4 point probe head

4-point head for high temperature and high resistivity, usable on equipment of the Pack4PP, Quadpro series and or for separate use. The standard head is designed in macor with 4 independent tips in tungsten or osmium. A bayonet and two screws make it easy to attach the tip to our 4-prong stand for precise and repeatable measurements.

Specifications:

• Material of the tips defined according to the type of layer to be measured
• Choice of parameters: Tip spacing (pitch), tip fineness, tip pressure
• Terminations: Flying leads, Banana jacks, Triax...

WL2508" HF semi-automatic probe station

HP1000V-PSVacuum mini probe station

Compact probing station for high temperature measurements under vacuum.
This completely hermetic station allows you to go up to 1000°C while putting your sample under vacuum.
Tungsten Rhenium tips, very resistant to high temperature and reliable. These tips can be manipulated manually thanks to micropositioners, which facilitates their precise placement on pads whose size is greater than or equal to 10 µm.

Applications:

- Electrical test: resistor, transistor, capacitor
- Electrodes, diodes
- Photovoltaic
- Nanomaterials
- Sensors, MEMS, OLED, infrared...
- Silicon wafer
- Microchip

Specifications:

• Measurements on unit samples, 50x 50mm
• Manual positioning with 4 micropositioners (Up to 7 micropositioners)
• Temperature range: Ambient to 1000°C
• Vaccum chamber

HVPHigh voltage probe holder

This probe holder series allow high voltage measurements, up to 20KV.

Tip holding by spindle or by screw.
Useful for IV measurements on HV transistors and HV diodes.

JA40040 GHz flexible cable for RF probe

Juncoax RF coaxial cable is full range from DC to 145GHz, covering flexible / semi-flexible / semi-rigid, super phase-stable, low loss, super light weight, cryogenic, and other cables for harsh environment, 50ohm /70ohm /100ohm and other custom resistance.

Its processing is mainly wrapping and weaving which is manufactured in dust-free stable-temp & stable humidity workshop.